Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
No
Federal
Summary
Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Details
| Solicitation Number | 1333ND26PNB030039 |
| Type | Award Notice |
| Posted | 2026-04-06T10:42:14 |
| NAICS Code | 334516 |
| State | MD |
| ZIP | 20899 |
Contact
| Name | Nina Lin |
| nina.lin@nist.gov |
Award
| Award Number | 1333ND26PNB030039 |
| Awardee | FEI COMPANY Hillsboro OR 97124 USA |